Production information
Quantum Efficiency Measurement System
IPCE-R
IPCE-R Quantum Efficiency Measurement System is developed and designed in accordance with IEC 60904-8 to engage in the research and development of high-efficiency solar cells and improve the bandgap of their materials. Using non-destructive detection technology, the DUT can be directly measured without vacuum environment. In addition, its excellent signal-to-noise ratio and high-resolution signal acquisition capabilities provide fast and accurate measurement results. Compact design, easy to operate, high cost performance with excellent technical support, IPCE-R can also be integrated with the glove box according to customer needs which is suitable for various types of solar cells and photodetectors measurement.
Features
- Manufacture and design in accordance with IEC 60904-8 standard
- Wavelength range: 300-1100 nm (can be extended to 2500 nm)
- Adopted AC and DC mode, suitable for all kinds of solar cells. (Silicon, OPV, PVK, DSSC, CIGS, CZTS and water splitting solar cell)
- Can provide ultra-smaill beam spot, suitable for the spctral response measurement of photodetector/photodiode
- Can be integrated with glove box, vacuum chamber or other customized sample chamber/test fixture
- Repeatability: >99.5 or more
- Voltage bias:0 - +/-10V (current < 20mA)
Standard Specifications
Main System | a. Wavelength range:300~1100nm (AC Mode) b. Compact system c. With External Quantum Efficiency (EQE) and Internal Quantum Efficiency (IQE) function d. Software interface (with the computer) |
Light Source | a. Xe lamp (Ozone Free) with high-efficiency condense module (we can also provide QTH lamp according to customers' requirements) b. Light intensity stability: 2% c. With lamp timer |
Beam Size | <= 1 mm x 1 mm |
Monochromator | a. Focal length:110 mm b. Resolution :≤1 nm c. Scanning interval:1~10 nm, adjustment d. Aperture: F/3.9 |
Filter Wheel | a. Can place 6 filters (maximum) b. Can be controlled manually or automatically |
Chopper | a. 4~500 Hz b. Resolution can achieve 0.01Hz, stability: <±0.05Hz |
Reference Detector | a. Silicon detector, with third party calibration certificate b. Measurement range: 300-1100 nm c. Ge (900-1800 nm) and InGaAs (1000-2500 nm) as options |
Lock-in Amplifier | a. Current resolution : 10fA (minimun) b. Dynamic reverse : >100dB c. Gain : 108 d. Time constant : 10ms~20Ks e. With automatic function f. Interface : RS232 g. Phase resolution : 0.01° h. Stability : <6ppm/℃ i. Offset: X, Y R can be offset up to +/-105% j. Sample rating :>500/s and 8000 point memory buffer for recording the time history of the measurement |
Software | a. Light intensity calibration function b. Spectral response (SR) measurement c. External Quantum Efficiency (EQE) measurement d. AM spectrum input,and Jsc calculation e. Mismatch factor (MMF) calculation function f. Save format: txt. and jpg. |
Voltage Bias | 0~±10V |
Computer | Official Windows operation system |