LBIC-Laser Beam Induced Current Measurement System
Laser Beam Induced Current Measurement System
LBIC
LBIC Laser Beam Induced Current Systemen provide fast high, resolution mapping of the photovoltaic response of solar cells over very large areas from single cells to modules. It is very ideal tool for the measurement of photovoltaic active areas, identification of defects, shunts, inactive regions and coating errors. Ultra-fast laser scanning enables devices tesing in seconds over larger area, compared to hours in ordinary XY-stage system.
Moreover, the low-noise system is immune to external light input and available in single wavelength or multi-wavelenght configurations for testing different photovoltaic responses. Roll-to-roll (R2R) compatability and a contactless electrode configuration is optional and allows inline process control.
Features
- Ultra-fast mapping speed (can measure 250 mm x 250 mm testing area in 10 seconds)
- Testing area: 250 mm x 250 mm
- Can equipped with different bias light or lasers to do the measurement for tandem solar cells
- High mapping resolution: <100 um (40 um spot), can be adjustable through the software
- Wavelength range: 400 nm-1100 nm (used 410 nm or 635 nm as standard excitation source), suitable for OPV and Perovskite (PVK) solar cells.
- Can do the mapping and analysis for single cells to serial connected modules
- Can draw the waffle surface of solar cell without the influences of noise. The best testing soultion for flexible solar cells.
- User-friendly Interface: automatic calibration, area selection, color maps, 2D and 3D imaging, active area determination. 可测试单个电池到小组件串联电池
Standard Specification
| Item | Description |
| Main Function | a. Can measure the photocurrent response from single cell to serial connected module b. Can equipped with different lasers and bias light to measure the tandem cells |
| Excitation Laser | a. 410 nm laser （Can extend to 3 lasers ） b. Software control |
| Testing Area | 250 mm x 250 mm |
| Resolution | a. < 100 um (adjustable) b. Can be contorlled by the software |
| Beam Size | 40 um |
| Measurement Time | a. 250 mm x 250 mm (100 um resolution): 100 seconds b. 250 mm x 250 mm (40 um resolution): 500 seconds |
| Shielding Box | Standard shielding box |
| Software | a. Automatic calibration b. Area selection, color maps c. 2D and 3D imaging d. Active area determination. e. Laser power adjustment function f. Maximum light intensity tracking g. Large area EQE calibration, mapping and EQE image (Optional function) |
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