Photoluminescence Mapping System
Production information
Fast Photocurrent Microscope Measurement System
FPM
FPM Fast Photocurrent Microscope Measurement System is suitable for oragnic and perovskite materials which can assist users to do the photocurrent and grain distribution measurement.
Features
- Non-destructive testing technology
- Suitable for measuring the photocurrent and grain distribution of OPV and PVK solar cell
- High resolution color PL image and spectrum result
Standard Specification (can be customized)
| Main System | a. Scanning core: XY Galvanometer scanning technology b. Resolution: micro-meter scale c. Scanning method: single direction d. Mapping resolution: 2048 x 2048 e. Maximum Mapping resolution: 1.1 fps / sec @ 512 x 512 |
| Light Source | a. LED white light source b. Kotler illumination system c. Testing area: >220 um @ 50x, d. FWHM of Laser: <1 um |
| Excitation Laser | a. Wavelength： 515 nm (Can be customized ） b. Maximum intensity： 25 mW |
| Software | a. Measurement time control b. Measurement range control c. light intensity control |
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